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Innovation and Patents

Focus Microwaves is the indisputable Innovator and its unique technology is protected by numerous awarded and pending patents.

  Recently awarded patents

• VHF HARMONIC IMPEDANCE TUNER

• METHOD FOR REDUCING POWER REQUIREMENTS IN ACTIVE LOAD PULL SYSTEM

• IMPEDANCE TUNER WITH INTEGRATED BIAS NETWORK

• LOW FREQUENCY IMPEDANCE TUNER APPARATUS

 Issued patents

1 8405,475Harmonic impedance tuner with four wideband probes and method

2 8,405,466

Wideband low frequency impedance tuner

3 8,405,405

Wideband I-V probe and method

4 8,400,238

Compact harmonic impedance tuner

5 8,362,787

Harmonic rejection tuner with adjustable short circuited resonators

6 8,358,186

Impedance tuners with resonant probes

7 8,212,629

Wideband low frequency impedance tuner

8 8,212,628

Harmonic impedance tuner with four wideband probes and method

9 8,203,348

Autonomous impedance tuner with human control interface

10 8,188,816

Compact harmonic impedance tuner

11 7,646,268

Low frequency harmonic load pull tuner and method

12 7,646,267

Low frequency electro-mechanical impedance tuner

13 7,561,004

Harmonic rejection tuner with adjustable resonators

14 7,449,893

Harmonic load pull tuner with resonant prematching module

15 7,248,866

Frequency selective load pull tuner and method

16 7,135,941

Triple probe automatic slide screw load pull tuner and method

17 7,102,457

Mechanically balanced microwave load pull tuner

18 7,053,628

High reflection microwave tuner using metal-dielectric probe and method

19 7,034,629

High frequency, high reflection pre-matching tuners with variable zero initialization

20 6,998,836

Low loss integration of wafer probes with microwave tuners

21 6,850,076

Microwave tuners for wideband high reflection applications

22 6,674,293

Adaptable pre-matched tuner system and method

23 6,414,563

Low-loss microwave device test fixture with adjustable blocks

24 6,297,649

Harmonic rejection load tuner

 

More pending patents

  • Load and Source Pull Setup for RF& Baseband Frequency

  • Waveguide Impedance Tuners with Planarity Adjustment for Wafer Probing

  • Adjustable Signal Sampling Sensor and Method

  • Noise Parameter Measurement System and Method